(S1868) 643-1A Length test object with 300nm period to pin sample plate by Agar Scientific
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The (S1868) 643-1A length test object mounted to a pin sample plate is a titanium-coated testing accessory designed for electron microscopy applications. Featuring a 300nm period, this component measures 3mm by 4mm with a thickness of 20 nm and delivers an accuracy of +/- 1%. It provides high contrast and excellent edge definition (Kantendef.), making it fully suitable for operation under acceleration voltages from 1 kV to 30 kV. This test object supports magnifications ranging from 5000x to over 200000x, allowing users to accurately calibrate and evaluate instrument performance across a wide range of high-resolution imaging conditions.
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Characteristics
| Manufacturer | Agar Scientific |
|---|---|
| Part number | (S1868) 643-1A |
| Inner Code | 529111 |
Technical specification
| Product type | Length test object pin sample plate |
|---|---|
| Period | 300nm |
| Dimensions | 3mm x 4mm |
| Thickness | 20 nm |
| Coating | Titanium-coated |
| Accuracy | +/- 1% |
| Voltage range | 1kV - 30 kV |
| Magnification | 5000x to over 200000x |