(S1868) 643-1A Length test object with 300nm period to pin sample plate by Agar Scientific

The (S1868) 643-1A length test object mounted to a pin sample plate is a titanium-coated testing accessory designed for electron microscopy applications. Featuring a 300nm period, this component measures 3mm by 4mm with a thickness of 20 nm and delivers an accuracy of +/- 1%. It provides high contrast and excellent edge definition (Kantendef.), making it fully suitable for operation under acceleration voltages from 1 kV to 30 kV. This test object supports magnifications ranging from 5000x to over 200000x, allowing users to accurately calibrate and evaluate instrument performance across a wide range of high-resolution imaging conditions.

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